McLeod, Euan, Dincer, T. Umut, Veli, Muhammed, Ertas, Yavuz N., Nguyen, Chau, Luo, Wei, Greenbaum, Alon, Feizi, Alborz, and Ozcan, Aydogan. High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy. ACS Nano 9.3 Web. doi:10.1021/acsnano.5b00388.

McLeod, Euan, Dincer, T. Umut, Veli, Muhammed, Ertas, Yavuz N., Nguyen, Chau, Luo, Wei, Greenbaum, Alon, Feizi, Alborz, & Ozcan, Aydogan. High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy. ACS Nano, 9 (3). https://doi.org/10.1021/acsnano.5b00388

McLeod, Euan, Dincer, T. Umut, Veli, Muhammed, Ertas, Yavuz N., Nguyen, Chau, Luo, Wei, Greenbaum, Alon, Feizi, Alborz, and Ozcan, Aydogan. "High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy". ACS Nano 9 (3). United States: American Chemical Society. https://doi.org/10.1021/acsnano.5b00388. https://par.nsf.gov/biblio/10000551.

@article{osti_10000551,
place = {United States}, title = {High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy}, url = {https://par.nsf.gov/biblio/10000551}, DOI = {10.1021/acsnano.5b00388}, abstractNote = {Not Available}, journal = {ACS Nano}, volume = {9}, number = {3}, publisher = {American Chemical Society}, author = {McLeod, Euan and Dincer, T. Umut and Veli, Muhammed and Ertas, Yavuz N. and Nguyen, Chau and Luo, Wei and Greenbaum, Alon and Feizi, Alborz and Ozcan, Aydogan}, }