Tung, L.-C., Cadden-Zimansky, P., Qi, J., Jiang, Z., and Smirnov, D. Measurement of graphite tight-binding parameters using high-field magnetoreflectance. Physical Review B 84.15 Web. doi:10.1103/PhysRevB.84.153405.

Tung, L.-C., Cadden-Zimansky, P., Qi, J., Jiang, Z., & Smirnov, D. Measurement of graphite tight-binding parameters using high-field magnetoreflectance. Physical Review B, 84 (15). https://doi.org/10.1103/PhysRevB.84.153405

Tung, L.-C., Cadden-Zimansky, P., Qi, J., Jiang, Z., and Smirnov, D. "Measurement of graphite tight-binding parameters using high-field magnetoreflectance". Physical Review B 84 (15). United States: American Physical Society. https://doi.org/10.1103/PhysRevB.84.153405. https://par.nsf.gov/biblio/10002107.

@article{osti_10002107,
place = {United States}, title = {Measurement of graphite tight-binding parameters using high-field magnetoreflectance}, url = {https://par.nsf.gov/biblio/10002107}, DOI = {10.1103/PhysRevB.84.153405}, abstractNote = {Not Available}, journal = {Physical Review B}, volume = {84}, number = {15}, publisher = {American Physical Society}, author = {Tung, L.-C. and Cadden-Zimansky, P. and Qi, J. and Jiang, Z. and Smirnov, D.}, }