Kim, Kwanpyo, Coh, Sinisa, Tan, Liang Z., Regan, William, Yuk, Jong Min, Chatterjee, Eric, Crommie, M. F., Cohen, Marvin L., Louie, Steven G., and Zettl, A. Raman Spectroscopy Study of Rotated Double-Layer Graphene: Misorientation-Angle Dependence of Electronic Structure. Physical Review Letters 108.24 Web. doi:10.1103/PhysRevLett.108.246103.
Kim, Kwanpyo, Coh, Sinisa, Tan, Liang Z., Regan, William, Yuk, Jong Min, Chatterjee, Eric, Crommie, M. F., Cohen, Marvin L., Louie, Steven G., and Zettl, A.
"Raman Spectroscopy Study of Rotated Double-Layer Graphene: Misorientation-Angle Dependence of Electronic Structure". Physical Review Letters 108 (24). United States: American Physical Society. https://doi.org/10.1103/PhysRevLett.108.246103.https://par.nsf.gov/biblio/10004113.
@article{osti_10004113,
place = {United States},
title = {Raman Spectroscopy Study of Rotated Double-Layer Graphene: Misorientation-Angle Dependence of Electronic Structure},
url = {https://par.nsf.gov/biblio/10004113},
DOI = {10.1103/PhysRevLett.108.246103},
abstractNote = {Not Available},
journal = {Physical Review Letters},
volume = {108},
number = {24},
publisher = {American Physical Society},
author = {Kim, Kwanpyo and Coh, Sinisa and Tan, Liang Z. and Regan, William and Yuk, Jong Min and Chatterjee, Eric and Crommie, M. F. and Cohen, Marvin L. and Louie, Steven G. and Zettl, A.},
}
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