Plateau, G. R., Geddes, C. G., Thorn, D. B., Chen, M., Benedetti, C., Esarey, E., Gonsalves, A. J., Matlis, N. H., Nakamura, K., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., Trotsenko, S., Kim, T. S., Battaglia, M., Stöhlker, Th., and Leemans, W. P. Low-Emittance Electron Bunches from a Laser-Plasma Accelerator Measured using Single-Shot X-Ray Spectroscopy. Physical Review Letters 109.6 Web. doi:10.1103/PhysRevLett.109.064802.
Plateau, G. R., Geddes, C. G., Thorn, D. B., Chen, M., Benedetti, C., Esarey, E., Gonsalves, A. J., Matlis, N. H., Nakamura, K., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., Trotsenko, S., Kim, T. S., Battaglia, M., Stöhlker, Th., & Leemans, W. P. Low-Emittance Electron Bunches from a Laser-Plasma Accelerator Measured using Single-Shot X-Ray Spectroscopy. Physical Review Letters, 109 (6). https://doi.org/10.1103/PhysRevLett.109.064802
Plateau, G. R., Geddes, C. G., Thorn, D. B., Chen, M., Benedetti, C., Esarey, E., Gonsalves, A. J., Matlis, N. H., Nakamura, K., Schroeder, C. B., Shiraishi, S., Sokollik, T., van Tilborg, J., Toth, Cs., Trotsenko, S., Kim, T. S., Battaglia, M., Stöhlker, Th., and Leemans, W. P.
"Low-Emittance Electron Bunches from a Laser-Plasma Accelerator Measured using Single-Shot X-Ray Spectroscopy". Physical Review Letters 109 (6). United States: American Physical Society. https://doi.org/10.1103/PhysRevLett.109.064802.https://par.nsf.gov/biblio/10004624.
@article{osti_10004624,
place = {United States},
title = {Low-Emittance Electron Bunches from a Laser-Plasma Accelerator Measured using Single-Shot X-Ray Spectroscopy},
url = {https://par.nsf.gov/biblio/10004624},
DOI = {10.1103/PhysRevLett.109.064802},
abstractNote = {Not Available},
journal = {Physical Review Letters},
volume = {109},
number = {6},
publisher = {American Physical Society},
author = {Plateau, G. R. and Geddes, C. G. and Thorn, D. B. and Chen, M. and Benedetti, C. and Esarey, E. and Gonsalves, A. J. and Matlis, N. H. and Nakamura, K. and Schroeder, C. B. and Shiraishi, S. and Sokollik, T. and van Tilborg, J. and Toth, Cs. and Trotsenko, S. and Kim, T. S. and Battaglia, M. and Stöhlker, Th. and Leemans, W. P.},
}
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