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Title: Spin-Relaxation Dynamics of E′ Centers at High Density in SiO2 Thin Films for Single-Spin Tunneling Force Microscopy
NSF-PAR ID:
10007701
Author(s) / Creator(s):
; ; ; ;
Publisher / Repository:
American Physical Society
Date Published:
Journal Name:
Physical Review Applied
Volume:
4
Issue:
2
ISSN:
2331-7019
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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