Fan, C., Ren, Y., Liu, C. T., Liaw, P. K., Yan, H. G., and Egami, T. Atomic migration and bonding characteristics during a glass transition investigated using as-cast Zr-Cu-Al. Physical Review B 83.19 Web. doi:10.1103/PhysRevB.83.195207.

Fan, C., Ren, Y., Liu, C. T., Liaw, P. K., Yan, H. G., & Egami, T. Atomic migration and bonding characteristics during a glass transition investigated using as-cast Zr-Cu-Al. Physical Review B, 83 (19). https://doi.org/10.1103/PhysRevB.83.195207

Fan, C., Ren, Y., Liu, C. T., Liaw, P. K., Yan, H. G., and Egami, T. "Atomic migration and bonding characteristics during a glass transition investigated using as-cast Zr-Cu-Al". Physical Review B 83 (19). United States: American Physical Society. https://doi.org/10.1103/PhysRevB.83.195207. https://par.nsf.gov/biblio/10010689.

@article{osti_10010689,
place = {United States}, title = {Atomic migration and bonding characteristics during a glass transition investigated using as-cast Zr-Cu-Al}, url = {https://par.nsf.gov/biblio/10010689}, DOI = {10.1103/PhysRevB.83.195207}, abstractNote = {Not Available}, journal = {Physical Review B}, volume = {83}, number = {19}, publisher = {American Physical Society}, author = {Fan, C. and Ren, Y. and Liu, C. T. and Liaw, P. K. and Yan, H. G. and Egami, T.}, }