Murray, Peter G., Martin, Iain W., Craig, Kieran, Hough, James, Robie, Raymond, Rowan, Sheila, Abernathy, Matt R., Pershing, Teal, and Penn, Steven. Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems. Physical Review D 92.6 Web. doi:10.1103/PhysRevD.92.062001.
Murray, Peter G., Martin, Iain W., Craig, Kieran, Hough, James, Robie, Raymond, Rowan, Sheila, Abernathy, Matt R., Pershing, Teal, and Penn, Steven.
"Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems". Physical Review D 92 (6). United States: American Physical Society. https://doi.org/10.1103/PhysRevD.92.062001.https://par.nsf.gov/biblio/10011918.
@article{osti_10011918,
place = {United States},
title = {Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems},
url = {https://par.nsf.gov/biblio/10011918},
DOI = {10.1103/PhysRevD.92.062001},
abstractNote = {Not Available},
journal = {Physical Review D},
volume = {92},
number = {6},
publisher = {American Physical Society},
author = {Murray, Peter G. and Martin, Iain W. and Craig, Kieran and Hough, James and Robie, Raymond and Rowan, Sheila and Abernathy, Matt R. and Pershing, Teal and Penn, Steven},
}
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