Park, K. W., Krivoy, E. M., Nair, H. P., Bank, S. R., and Yu, E. T. Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy. Nanotechnology 26.26 Web. doi:10.1088/0957-4484/26/26/265701.

Park, K. W., Krivoy, E. M., Nair, H. P., Bank, S. R., & Yu, E. T. Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy. Nanotechnology, 26 (26). https://doi.org/10.1088/0957-4484/26/26/265701

Park, K. W., Krivoy, E. M., Nair, H. P., Bank, S. R., and Yu, E. T. "Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy". Nanotechnology 26 (26). Country unknown/Code not available: IOP Publishing. https://doi.org/10.1088/0957-4484/26/26/265701. https://par.nsf.gov/biblio/10014720.

@article{osti_10014720,
place = {Country unknown/Code not available}, title = {Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy}, url = {https://par.nsf.gov/biblio/10014720}, DOI = {10.1088/0957-4484/26/26/265701}, abstractNote = {Not Available}, journal = {Nanotechnology}, volume = {26}, number = {26}, publisher = {IOP Publishing}, author = {Park, K. W. and Krivoy, E. M. and Nair, H. P. and Bank, S. R. and Yu, E. T.}, }