Orlov, Alexei O., Fay, Patrick, Snider, Gregory L., Jehl, Xavier, Barraud, Sylvain, and Sanquer, Marc. Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Retrieved from https://par.nsf.gov/biblio/10018265. IEEE Nanotechnology Magazine 9.2 Web. doi:10.1109/MNANO.2015.2409411.

Orlov, Alexei O., Fay, Patrick, Snider, Gregory L., Jehl, Xavier, Barraud, Sylvain, & Sanquer, Marc. Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. IEEE Nanotechnology Magazine, 9 (2). Retrieved from https://par.nsf.gov/biblio/10018265. https://doi.org/10.1109/MNANO.2015.2409411

Orlov, Alexei O., Fay, Patrick, Snider, Gregory L., Jehl, Xavier, Barraud, Sylvain, and Sanquer, Marc. "Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.". IEEE Nanotechnology Magazine 9 (2). Country unknown/Code not available. https://doi.org/10.1109/MNANO.2015.2409411. https://par.nsf.gov/biblio/10018265.

@article{osti_10018265,
place = {Country unknown/Code not available}, title = {Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.}, url = {https://par.nsf.gov/biblio/10018265}, DOI = {10.1109/MNANO.2015.2409411}, abstractNote = {}, journal = {IEEE Nanotechnology Magazine}, volume = {9}, number = {2}, author = {Orlov, Alexei O. and Fay, Patrick and Snider, Gregory L. and Jehl, Xavier and Barraud, Sylvain and Sanquer, Marc}, }