Abernathy, M. R., Smith, N., Korth, W. Z., Adhikari, R. X., Prokhorov, L. G., Koptsov, D. V., and Mitrofanov, V. P. Measurement of mechanical loss in the Acktar Black coating of silicon wafers. Classical and Quantum Gravity 33.18 Web. doi:10.1088/0264-9381/33/18/185002.

Abernathy, M. R., Smith, N., Korth, W. Z., Adhikari, R. X., Prokhorov, L. G., Koptsov, D. V., & Mitrofanov, V. P. Measurement of mechanical loss in the Acktar Black coating of silicon wafers. Classical and Quantum Gravity, 33 (18). https://doi.org/10.1088/0264-9381/33/18/185002

Abernathy, M. R., Smith, N., Korth, W. Z., Adhikari, R. X., Prokhorov, L. G., Koptsov, D. V., and Mitrofanov, V. P. "Measurement of mechanical loss in the Acktar Black coating of silicon wafers". Classical and Quantum Gravity 33 (18). Country unknown/Code not available: IOP Publishing. https://doi.org/10.1088/0264-9381/33/18/185002. https://par.nsf.gov/biblio/10018798.

@article{osti_10018798,
place = {Country unknown/Code not available}, title = {Measurement of mechanical loss in the Acktar Black coating of silicon wafers}, url = {https://par.nsf.gov/biblio/10018798}, DOI = {10.1088/0264-9381/33/18/185002}, abstractNote = {Not Available}, journal = {Classical and Quantum Gravity}, volume = {33}, number = {18}, publisher = {IOP Publishing}, author = {Abernathy, M. R. and Smith, N. and Korth, W. Z. and Adhikari, R. X. and Prokhorov, L. G. and Koptsov, D. V. and Mitrofanov, V. P.}, }