Xiang, Y., Guo, F-W, Lu, T-M, and Wang, G-C. Reflection high-energy electron diffraction measurements of reciprocal space structure of 2D materials. Nanotechnology 27.48 Web. doi:10.1088/0957-4484/27/48/485703.
@article{osti_10020659,
place = {Country unknown/Code not available},
title = {Reflection high-energy electron diffraction measurements of reciprocal space structure of 2D materials},
url = {https://par.nsf.gov/biblio/10020659},
DOI = {10.1088/0957-4484/27/48/485703},
abstractNote = {Not Available},
journal = {Nanotechnology},
volume = {27},
number = {48},
publisher = {IOP Publishing},
author = {Xiang, Y. and Guo, F-W and Lu, T-M and Wang, G-C},
}
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