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Title: Substrate-independent analysis of microcrystalline silicon thin films using UV Raman spectroscopy: Substrate-independent analysis of µc-Si thin films
NSF-PAR ID:
10026496
Author(s) / Creator(s):
 ;  ;  ;  ;  ;  ;  ;  
Publisher / Repository:
Wiley Blackwell (John Wiley & Sons)
Date Published:
Journal Name:
physica status solidi (b)
Volume:
254
Issue:
9
ISSN:
0370-1972
Page Range / eLocation ID:
1700204
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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