Vajente, G., Ananyeva, A., Billingsley, G., Gustafson, E., Heptonstall, A., Sanchez, E., and Torrie, C. A high throughput instrument to measure mechanical losses in thin film coatings. Review of Scientific Instruments 88.7 Web. doi:10.1063/1.4990036.

Vajente, G., Ananyeva, A., Billingsley, G., Gustafson, E., Heptonstall, A., Sanchez, E., & Torrie, C. A high throughput instrument to measure mechanical losses in thin film coatings. Review of Scientific Instruments, 88 (7). https://doi.org/10.1063/1.4990036

Vajente, G., Ananyeva, A., Billingsley, G., Gustafson, E., Heptonstall, A., Sanchez, E., and Torrie, C. "A high throughput instrument to measure mechanical losses in thin film coatings". Review of Scientific Instruments 88 (7). United States: American Institute of Physics. https://doi.org/10.1063/1.4990036. https://par.nsf.gov/biblio/10028266.

@article{osti_10028266,
place = {United States}, title = {A high throughput instrument to measure mechanical losses in thin film coatings}, url = {https://par.nsf.gov/biblio/10028266}, DOI = {10.1063/1.4990036}, abstractNote = {Not Available}, journal = {Review of Scientific Instruments}, volume = {88}, number = {7}, publisher = {American Institute of Physics}, author = {Vajente, G. and Ananyeva, A. and Billingsley, G. and Gustafson, E. and Heptonstall, A. and Sanchez, E. and Torrie, C.}, }