High Conduction Hopping Behavior Induced in Transition Metal Dichalcogenides by Percolating Defect Networks: Toward Atomically Thin Circuits
- PAR ID:
- 10033340
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Functional Materials
- Volume:
- 27
- Issue:
- 36
- ISSN:
- 1616-301X
- Page Range / eLocation ID:
- 1702829
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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