A tunnel FET design for high-current, 120 mV operation
- Award ID(s):
- 1639958
- PAR ID:
- 10038710
- Date Published:
- Journal Name:
- 2016 IEEE International Electron Devices Meeting (IEDM)
- Page Range / eLocation ID:
- 30.2.1 to 30.2.4
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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