Zheng, P. Y., Zhou, T., Engler, B. J., Chawla, J. S., Hull, R., and Gall, D. Surface roughness dependence of the electrical resistivity of W(001) layers. Journal of Applied Physics 122.9 Web. doi:10.1063/1.4994001.

Zheng, P. Y., Zhou, T., Engler, B. J., Chawla, J. S., Hull, R., & Gall, D. Surface roughness dependence of the electrical resistivity of W(001) layers. Journal of Applied Physics, 122 (9). https://doi.org/10.1063/1.4994001

Zheng, P. Y., Zhou, T., Engler, B. J., Chawla, J. S., Hull, R., and Gall, D. "Surface roughness dependence of the electrical resistivity of W(001) layers". Journal of Applied Physics 122 (9). United States: American Institute of Physics. https://doi.org/10.1063/1.4994001. https://par.nsf.gov/biblio/10040684.

@article{osti_10040684,
place = {United States}, title = {Surface roughness dependence of the electrical resistivity of W(001) layers}, url = {https://par.nsf.gov/biblio/10040684}, DOI = {10.1063/1.4994001}, abstractNote = {Not Available}, journal = {Journal of Applied Physics}, volume = {122}, number = {9}, publisher = {American Institute of Physics}, author = {Zheng, P. Y. and Zhou, T. and Engler, B. J. and Chawla, J. S. and Hull, R. and Gall, D.}, }