Moon, Hyunkyu, Comi, Troy J., Dunham, Sage J., Kwon, Beomjin, Sweedler, Jonathan V., and King, William P. Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. Retrieved from https://par.nsf.gov/biblio/10041431. 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) . Web. doi:10.1109/TRANSDUCERS.2017.7993978.

Moon, Hyunkyu, Comi, Troy J., Dunham, Sage J., Kwon, Beomjin, Sweedler, Jonathan V., & King, William P. Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency. 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), (). Retrieved from https://par.nsf.gov/biblio/10041431. https://doi.org/10.1109/TRANSDUCERS.2017.7993978

Moon, Hyunkyu, Comi, Troy J., Dunham, Sage J., Kwon, Beomjin, Sweedler, Jonathan V., and King, William P. "Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency". 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) (). Country unknown/Code not available. https://doi.org/10.1109/TRANSDUCERS.2017.7993978. https://par.nsf.gov/biblio/10041431.

@article{osti_10041431,
place = {Country unknown/Code not available}, title = {Microscale transport physics during atomic force microscopy mass spectrometry and improved sampling efficiency}, url = {https://par.nsf.gov/biblio/10041431}, DOI = {10.1109/TRANSDUCERS.2017.7993978}, abstractNote = {}, journal = {19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)}, author = {Moon, Hyunkyu and Comi, Troy J. and Dunham, Sage J. and Kwon, Beomjin and Sweedler, Jonathan V. and King, William P.}, }