Montoya, John A., Tian, Zhao-Bing, Krishna, Sanjay, and Padilla, Willie J. Ultra-thin infrared metamaterial detector for multicolor imaging applications. Optics Express 25.19 Web. doi:10.1364/OE.25.023343.

Montoya, John A., Tian, Zhao-Bing, Krishna, Sanjay, & Padilla, Willie J. Ultra-thin infrared metamaterial detector for multicolor imaging applications. Optics Express, 25 (19). https://doi.org/10.1364/OE.25.023343

Montoya, John A., Tian, Zhao-Bing, Krishna, Sanjay, and Padilla, Willie J. "Ultra-thin infrared metamaterial detector for multicolor imaging applications". Optics Express 25 (19). Country unknown/Code not available: Optical Society of America. https://doi.org/10.1364/OE.25.023343. https://par.nsf.gov/biblio/10041593.

@article{osti_10041593,
place = {Country unknown/Code not available}, title = {Ultra-thin infrared metamaterial detector for multicolor imaging applications}, url = {https://par.nsf.gov/biblio/10041593}, DOI = {10.1364/OE.25.023343}, abstractNote = {Not Available}, journal = {Optics Express}, volume = {25}, number = {19}, publisher = {Optical Society of America}, author = {Montoya, John A. and Tian, Zhao-Bing and Krishna, Sanjay and Padilla, Willie J.}, }