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  • Deviations from Vegard's law in semiconductor thin films measured with X-ray diffraction and Rutherford backscattering: The Ge 1- y Sn y and Ge 1- x Si x cases
Title: Deviations from Vegard's law in semiconductor thin films measured with X-ray diffraction and Rutherford backscattering: The Ge 1- y Sn y and Ge 1- x Si x cases
NSF-PAR ID:
10042669
Author(s) / Creator(s):
 ;  ;  ;  ;  
Publisher / Repository:
American Institute of Physics
Date Published:
Journal Name:
Journal of Applied Physics
Volume:
122
Issue:
12
ISSN:
0021-8979
Page Range / eLocation ID:
125702
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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