Ceballos, A., Chen, Zhanghui, Schneider, O., Bordel, C., Wang, Lin-Wang, and Hellman, F. Effect of strain and thickness on the transition temperature of epitaxial FeRh thin-films. Applied Physics Letters 111.17 Web. doi:10.1063/1.4997901.
Ceballos, A., Chen, Zhanghui, Schneider, O., Bordel, C., Wang, Lin-Wang, & Hellman, F. Effect of strain and thickness on the transition temperature of epitaxial FeRh thin-films. Applied Physics Letters, 111 (17). https://doi.org/10.1063/1.4997901
Ceballos, A., Chen, Zhanghui, Schneider, O., Bordel, C., Wang, Lin-Wang, and Hellman, F.
"Effect of strain and thickness on the transition temperature of epitaxial FeRh thin-films". Applied Physics Letters 111 (17). United States: American Institute of Physics. https://doi.org/10.1063/1.4997901.https://par.nsf.gov/biblio/10045444.
@article{osti_10045444,
place = {United States},
title = {Effect of strain and thickness on the transition temperature of epitaxial FeRh thin-films},
url = {https://par.nsf.gov/biblio/10045444},
DOI = {10.1063/1.4997901},
abstractNote = {Not Available},
journal = {Applied Physics Letters},
volume = {111},
number = {17},
publisher = {American Institute of Physics},
author = {Ceballos, A. and Chen, Zhanghui and Schneider, O. and Bordel, C. and Wang, Lin-Wang and Hellman, F.},
}
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