Dwyer, Ryan P., Smieska, Louisa M., Tirmzi, Ali Moeed, and Marohn, John A. Vector electric field measurement via position-modulated Kelvin probe force microscopy. Applied Physics Letters 111.17 Web. doi:10.1063/1.4999172.

Dwyer, Ryan P., Smieska, Louisa M., Tirmzi, Ali Moeed, & Marohn, John A. Vector electric field measurement via position-modulated Kelvin probe force microscopy. Applied Physics Letters, 111 (17). https://doi.org/10.1063/1.4999172

Dwyer, Ryan P., Smieska, Louisa M., Tirmzi, Ali Moeed, and Marohn, John A. "Vector electric field measurement via position-modulated Kelvin probe force microscopy". Applied Physics Letters 111 (17). United States: American Institute of Physics. https://doi.org/10.1063/1.4999172. https://par.nsf.gov/biblio/10045881.

@article{osti_10045881,
place = {United States}, title = {Vector electric field measurement via position-modulated Kelvin probe force microscopy}, url = {https://par.nsf.gov/biblio/10045881}, DOI = {10.1063/1.4999172}, abstractNote = {Not Available}, journal = {Applied Physics Letters}, volume = {111}, number = {17}, publisher = {American Institute of Physics}, author = {Dwyer, Ryan P. and Smieska, Louisa M. and Tirmzi, Ali Moeed and Marohn, John A.}, }