Bandara, Y. M., Nichols, Jonathan W., Iroshika Karawdeniya, Buddini, and Dwyer, Jason R. Conductance-based profiling of nanopores: Accommodating fabrication irregularities. ELECTROPHORESIS 39.4 Web. doi:10.1002/elps.201700299.

Bandara, Y. M., Nichols, Jonathan W., Iroshika Karawdeniya, Buddini, & Dwyer, Jason R. Conductance-based profiling of nanopores: Accommodating fabrication irregularities. ELECTROPHORESIS, 39 (4). https://doi.org/10.1002/elps.201700299

Bandara, Y. M., Nichols, Jonathan W., Iroshika Karawdeniya, Buddini, and Dwyer, Jason R. "Conductance-based profiling of nanopores: Accommodating fabrication irregularities". ELECTROPHORESIS 39 (4). Germany: Wiley Blackwell (John Wiley & Sons). https://doi.org/10.1002/elps.201700299. https://par.nsf.gov/biblio/10047915.

@article{osti_10047915,
place = {Germany}, title = {Conductance-based profiling of nanopores: Accommodating fabrication irregularities}, url = {https://par.nsf.gov/biblio/10047915}, DOI = {10.1002/elps.201700299}, abstractNote = {Not Available}, journal = {ELECTROPHORESIS}, volume = {39}, number = {4}, publisher = {Wiley Blackwell (John Wiley & Sons)}, author = {Bandara, Y. M. and Nichols, Jonathan W. and Iroshika Karawdeniya, Buddini and Dwyer, Jason R.}, }