Different from nonvolatile memory applications, neuromorphic computing applications utilize not only the static conductance states but also the switching dynamics for computing, which calls for compact dynamical models of memristive devices. In this work, a generalized model to simulate diffusive and drift memristors with the same set of equations is presented, which have been used to reproduce experimental results faithfully. The diffusive memristor is chosen as the basis for the generalized model because it possesses complex dynamical properties that are difficult to model efficiently. A data set from statistical measurements on SiO2:Ag diffusive memristors is collected to verify the validity of the general model. As an application example, spike‐timing‐dependent plasticity is demonstrated with an artificial synapse consisting of a diffusive memristor and a drift memristor, both modeled with this comprehensive compact model.
Threshold switches with Ag or Cu active metal species are volatile memristors (also termed diffusive memristors) featuring spontaneous rupture of conduction channels. The temporal dynamics of the conductance evolution is closely related to the electrochemical and diffusive dynamics of the active metals which could be modulated by electric field strength, biasing duration, temperature, and so on. Microscopic pictures by electron microscopy and quantitative thermodynamics modeling are examined to give insights into the underlying physics of the switching. Depending on the time scale of the relaxation process, such devices find a variety of novel applications in electronics, ranging from selector devices for memories to synaptic devices for neuromorphic computing.
more » « less- NSF-PAR ID:
- 10048354
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Functional Materials
- Volume:
- 28
- Issue:
- 6
- ISSN:
- 1616-301X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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