Electronic Conduction Mechanisms in Insulators

Chiang, Tsung-Han (ORCID:0000000315062880); Wager, John F.

doi:10.1109/TED.2017.2776612

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Citation Details

Electronic Conduction Mechanisms in Insulators

PAR ID:: 10048540

Author(s) / Creator(s):: Chiang, Tsung-Han; Wager, John F.

Publisher / Repository:: Institute of Electrical and Electronics Engineers

Date Published:: 2018-01-01

Journal Name:: IEEE Transactions on Electron Devices

Volume:: 65

Issue:: 1

ISSN:: 0018-9383

Page Range / eLocation ID:: p. 223-230

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Journal Article:
https://doi.org/10.1109/TED.2017.2776612

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