Kim, Min-Cheol, Silberberg, Yaron R., Abeyaratne, Rohan, Kamm, Roger D., and Asada, H. Harry. Computational modeling of three-dimensional ECM-rigidity sensing to guide directed cell migration. Proceedings of the National Academy of Sciences 115.3 Web. doi:10.1073/pnas.1717230115.

Kim, Min-Cheol, Silberberg, Yaron R., Abeyaratne, Rohan, Kamm, Roger D., & Asada, H. Harry. Computational modeling of three-dimensional ECM-rigidity sensing to guide directed cell migration. Proceedings of the National Academy of Sciences, 115 (3). https://doi.org/10.1073/pnas.1717230115

Kim, Min-Cheol, Silberberg, Yaron R., Abeyaratne, Rohan, Kamm, Roger D., and Asada, H. Harry. "Computational modeling of three-dimensional ECM-rigidity sensing to guide directed cell migration". Proceedings of the National Academy of Sciences 115 (3). United States: Proceedings of the National Academy of Sciences. https://doi.org/10.1073/pnas.1717230115. https://par.nsf.gov/biblio/10048989.

@article{osti_10048989,
place = {United States}, title = {Computational modeling of three-dimensional ECM-rigidity sensing to guide directed cell migration}, url = {https://par.nsf.gov/biblio/10048989}, DOI = {10.1073/pnas.1717230115}, abstractNote = {Not Available}, journal = {Proceedings of the National Academy of Sciences}, volume = {115}, number = {3}, publisher = {Proceedings of the National Academy of Sciences}, author = {Kim, Min-Cheol and Silberberg, Yaron R. and Abeyaratne, Rohan and Kamm, Roger D. and Asada, H. Harry}, }