Berk, C., Ganss, F., Jaris, M., Albrecht, M., and Schmidt, H. All-optical measurement of interlayer exchange coupling in Fe/Pt/FePt thin films. Applied Physics Letters 112.5 Web. doi:10.1063/1.5004686.
Berk, C., Ganss, F., Jaris, M., Albrecht, M., and Schmidt, H.
"All-optical measurement of interlayer exchange coupling in Fe/Pt/FePt thin films". Applied Physics Letters 112 (5). United States: American Institute of Physics. https://doi.org/10.1063/1.5004686.https://par.nsf.gov/biblio/10050336.
@article{osti_10050336,
place = {United States},
title = {All-optical measurement of interlayer exchange coupling in Fe/Pt/FePt thin films},
url = {https://par.nsf.gov/biblio/10050336},
DOI = {10.1063/1.5004686},
abstractNote = {Not Available},
journal = {Applied Physics Letters},
volume = {112},
number = {5},
publisher = {American Institute of Physics},
author = {Berk, C. and Ganss, F. and Jaris, M. and Albrecht, M. and Schmidt, H.},
}
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