Shalindar, A. J., Webster, P. T., Wilkens, B. J., Alford, T. L., and Johnson, S. R. Measurement of InAsBi mole fraction and InBi lattice constant using Rutherford backscattering spectrometry and X-ray diffraction. Journal of Applied Physics 120.14 Web. doi:10.1063/1.4964799.

Shalindar, A. J., Webster, P. T., Wilkens, B. J., Alford, T. L., & Johnson, S. R. Measurement of InAsBi mole fraction and InBi lattice constant using Rutherford backscattering spectrometry and X-ray diffraction. Journal of Applied Physics, 120 (14). https://doi.org/10.1063/1.4964799

Shalindar, A. J., Webster, P. T., Wilkens, B. J., Alford, T. L., and Johnson, S. R. "Measurement of InAsBi mole fraction and InBi lattice constant using Rutherford backscattering spectrometry and X-ray diffraction". Journal of Applied Physics 120 (14). United States: American Institute of Physics. https://doi.org/10.1063/1.4964799. https://par.nsf.gov/biblio/10051816.

@article{osti_10051816,
place = {United States}, title = {Measurement of InAsBi mole fraction and InBi lattice constant using Rutherford backscattering spectrometry and X-ray diffraction}, url = {https://par.nsf.gov/biblio/10051816}, DOI = {10.1063/1.4964799}, abstractNote = {Not Available}, journal = {Journal of Applied Physics}, volume = {120}, number = {14}, publisher = {American Institute of Physics}, author = {Shalindar, A. J. and Webster, P. T. and Wilkens, B. J. and Alford, T. L. and Johnson, S. R.}, }