Sub-10 nm nanopantography

Tian, Siyuan; Donnelly, Vincent M.; Ruchhoeft, Paul; Economou, Demetre J.

doi:10.1063/1.4935552

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Citation Details

Sub-10 nm nanopantography

PAR ID:: 10051992

Author(s) / Creator(s):: Tian, Siyuan ; Donnelly, Vincent M. ; Ruchhoeft, Paul ; Economou, Demetre J.

Publisher / Repository:: American Institute of Physics

Date Published:: 2015-11-09

Journal Name:: Applied Physics Letters

Volume:: 107

Issue:: 19

ISSN:: 0003-6951

Page Range / eLocation ID:: 193109

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Journal Article:
https://doi.org/10.1063/1.4935552

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