Shaw, B. H., Steinke, S., van Tilborg, J., and Leemans, W. P. Reflectance characterization of tape-based plasma mirrors. Physics of Plasmas 23.6 Web. doi:10.1063/1.4954242.
Shaw, B. H., Steinke, S., van Tilborg, J., & Leemans, W. P. Reflectance characterization of tape-based plasma mirrors. Physics of Plasmas, 23 (6). https://doi.org/10.1063/1.4954242
@article{osti_10052051,
place = {United States},
title = {Reflectance characterization of tape-based plasma mirrors},
url = {https://par.nsf.gov/biblio/10052051},
DOI = {10.1063/1.4954242},
abstractNote = {Not Available},
journal = {Physics of Plasmas},
volume = {23},
number = {6},
publisher = {American Institute of Physics},
author = {Shaw, B. H. and Steinke, S. and van Tilborg, J. and Leemans, W. P.},
}
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