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Title: Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material
NSF-PAR ID:
10052634
Author(s) / Creator(s):
 ;  ;  ;  ;  ;  ;  ;  ;  ;  
Publisher / Repository:
American Institute of Physics
Date Published:
Journal Name:
Journal of Applied Physics
Volume:
119
Issue:
3
ISSN:
0021-8979
Page Range / eLocation ID:
035101
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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