Heilman, A. L., and Gordon, M. J. Tip-enhanced near-field optical microscope with side-on and ATR-mode sample excitation for super-resolution Raman imaging of surfaces. Journal of Applied Physics 119.22 Web. doi:10.1063/1.4953578.

Heilman, A. L., & Gordon, M. J. Tip-enhanced near-field optical microscope with side-on and ATR-mode sample excitation for super-resolution Raman imaging of surfaces. Journal of Applied Physics, 119 (22). https://doi.org/10.1063/1.4953578

Heilman, A. L., and Gordon, M. J. "Tip-enhanced near-field optical microscope with side-on and ATR-mode sample excitation for super-resolution Raman imaging of surfaces". Journal of Applied Physics 119 (22). United States: American Institute of Physics. https://doi.org/10.1063/1.4953578. https://par.nsf.gov/biblio/10052644.

@article{osti_10052644,
place = {United States}, title = {Tip-enhanced near-field optical microscope with side-on and ATR-mode sample excitation for super-resolution Raman imaging of surfaces}, url = {https://par.nsf.gov/biblio/10052644}, DOI = {10.1063/1.4953578}, abstractNote = {Not Available}, journal = {Journal of Applied Physics}, volume = {119}, number = {22}, publisher = {American Institute of Physics}, author = {Heilman, A. L. and Gordon, M. J.}, }