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Title: Critical thickness investigation of MBE-grown GaInAs/GaAs and GaAsSb/GaAs heterostructures
NSF-PAR ID:
10052734
Author(s) / Creator(s):
; ; ; ;  ; ;
Publisher / Repository:
American Vacuum Society
Date Published:
Journal Name:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Volume:
34
Issue:
2
ISSN:
2166-2746
Page Range / eLocation ID:
02L113
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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