Critical thickness investigation of MBE-grown GaInAs/GaAs and GaAsSb/GaAs heterostructures
- NSF-PAR ID:
- 10052734
- Publisher / Repository:
- American Vacuum Society
- Date Published:
- Journal Name:
- Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
- Volume:
- 34
- Issue:
- 2
- ISSN:
- 2166-2746
- Page Range / eLocation ID:
- 02L113
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation