Zhang, Dongzhou, Jackson, Jennifer M., Zhao, Jiyong, Sturhahn, Wolfgang, Alp, E. Ercan, Toellner, Thomas S., and Hu, Michael Y. Fast temperature spectrometer for samples under extreme conditions. Review of Scientific Instruments 86.1 Web. doi:10.1063/1.4905431.

Zhang, Dongzhou, Jackson, Jennifer M., Zhao, Jiyong, Sturhahn, Wolfgang, Alp, E. Ercan, Toellner, Thomas S., & Hu, Michael Y. Fast temperature spectrometer for samples under extreme conditions. Review of Scientific Instruments, 86 (1). https://doi.org/10.1063/1.4905431

Zhang, Dongzhou, Jackson, Jennifer M., Zhao, Jiyong, Sturhahn, Wolfgang, Alp, E. Ercan, Toellner, Thomas S., and Hu, Michael Y. "Fast temperature spectrometer for samples under extreme conditions". Review of Scientific Instruments 86 (1). United States: American Institute of Physics. https://doi.org/10.1063/1.4905431. https://par.nsf.gov/biblio/10052992.

@article{osti_10052992,
place = {United States}, title = {Fast temperature spectrometer for samples under extreme conditions}, url = {https://par.nsf.gov/biblio/10052992}, DOI = {10.1063/1.4905431}, abstractNote = {Not Available}, journal = {Review of Scientific Instruments}, volume = {86}, number = {1}, publisher = {American Institute of Physics}, author = {Zhang, Dongzhou and Jackson, Jennifer M. and Zhao, Jiyong and Sturhahn, Wolfgang and Alp, E. Ercan and Toellner, Thomas S. and Hu, Michael Y.}, }