Liu, Yumeng, Liu, Huiliang, Chu, Yao, Cui, Yong, Hayasaka, Takeshi, Dasaka, Vaishno, Nguyen, Luu, and Lin, Liwei. Defect-Induced Gas Adsorption on Graphene Transistors. Advanced Materials Interfaces 5.9 Web. doi:10.1002/admi.201701640.

Liu, Yumeng, Liu, Huiliang, Chu, Yao, Cui, Yong, Hayasaka, Takeshi, Dasaka, Vaishno, Nguyen, Luu, & Lin, Liwei. Defect-Induced Gas Adsorption on Graphene Transistors. Advanced Materials Interfaces, 5 (9). https://doi.org/10.1002/admi.201701640

Liu, Yumeng, Liu, Huiliang, Chu, Yao, Cui, Yong, Hayasaka, Takeshi, Dasaka, Vaishno, Nguyen, Luu, and Lin, Liwei. "Defect-Induced Gas Adsorption on Graphene Transistors". Advanced Materials Interfaces 5 (9). Germany: Wiley Blackwell (John Wiley & Sons). https://doi.org/10.1002/admi.201701640. https://par.nsf.gov/biblio/10053467.

@article{osti_10053467,
place = {Germany}, title = {Defect-Induced Gas Adsorption on Graphene Transistors}, url = {https://par.nsf.gov/biblio/10053467}, DOI = {10.1002/admi.201701640}, abstractNote = {Not Available}, journal = {Advanced Materials Interfaces}, volume = {5}, number = {9}, publisher = {Wiley Blackwell (John Wiley & Sons)}, author = {Liu, Yumeng and Liu, Huiliang and Chu, Yao and Cui, Yong and Hayasaka, Takeshi and Dasaka, Vaishno and Nguyen, Luu and Lin, Liwei}, }