Majeed, Hassaan, Ma, Lihong, Lee, Young Jae, Kandel, Mikhail, Min, Eunjung, Jung, Woonggyu, Best-Popescu, Catherine, and Popescu, Gabriel. Magnified Image Spatial Spectrum (MISS) microscopy for nanometer and millisecond scale label-free imaging. Optics Express 26.5 Web. doi:10.1364/OE.26.005423.

Majeed, Hassaan, Ma, Lihong, Lee, Young Jae, Kandel, Mikhail, Min, Eunjung, Jung, Woonggyu, Best-Popescu, Catherine, & Popescu, Gabriel. Magnified Image Spatial Spectrum (MISS) microscopy for nanometer and millisecond scale label-free imaging. Optics Express, 26 (5). https://doi.org/10.1364/OE.26.005423

Majeed, Hassaan, Ma, Lihong, Lee, Young Jae, Kandel, Mikhail, Min, Eunjung, Jung, Woonggyu, Best-Popescu, Catherine, and Popescu, Gabriel. "Magnified Image Spatial Spectrum (MISS) microscopy for nanometer and millisecond scale label-free imaging". Optics Express 26 (5). Country unknown/Code not available: Optical Society of America. https://doi.org/10.1364/OE.26.005423. https://par.nsf.gov/biblio/10053519.

@article{osti_10053519,
place = {Country unknown/Code not available}, title = {Magnified Image Spatial Spectrum (MISS) microscopy for nanometer and millisecond scale label-free imaging}, url = {https://par.nsf.gov/biblio/10053519}, DOI = {10.1364/OE.26.005423}, abstractNote = {Not Available}, journal = {Optics Express}, volume = {26}, number = {5}, publisher = {Optical Society of America}, author = {Majeed, Hassaan and Ma, Lihong and Lee, Young Jae and Kandel, Mikhail and Min, Eunjung and Jung, Woonggyu and Best-Popescu, Catherine and Popescu, Gabriel}, }