More Like this

1. Exploiting Local and Cloud Sensor Fusion in Intermittently Connected Sensor Networks

   https://doi.org/10.1109/GLOBECOM42002.2020.9348131  

   Yemini, Michal ; Gil, Stephanie ; Goldsmith, Andrea ( December 2020 , Globecomm)
2. Sedimentation event sensor: New ocean instrument for in situ imaging and fluorometry of sinking particulate matter: Sedimentation event sensor

   https://doi.org/10.1002/lom3.10131  

   McGill, Paul R. ; Henthorn, Richard G. ; Bird, Larry E. ; Huffard, Christine L. ; Klimov, Dennis V. ; Smith, Kenneth L. ( December 2016 , Limnology and Oceanography: Methods)
3. Effects of the textile-sensor interface on stitched strain sensor performance

   https://doi.org/10.1145/3341163.3347717  

   Dupler, Ellen ; Dunne, Lucy E. ( January 2019 , Proceedings of the 23rd International Symposium on Wearable Computers)
4. Movement-Efficient Sensor Deployment in Wireless Sensor Networks With Limited Communication Range

   https://doi.org/10.1109/TWC.2019.2914199  

   Guo, Jun ; Jafarkhani, Hamid ( July 2019 , IEEE Transactions on Wireless Communications)
5. Sensor Egregium—An Atomic Force Microscope Sensor for Continuously Variable Resonance Amplification

   https://doi.org/10.1115/1.4050274  

   Shihab, Rafiul ; Jalil, Tasmirul ; Gulsacan, Burak ; Aureli, Matteo ; Tung, Ryan ( August 2021 , Journal of Vibration and Acoustics)

   Abstract Numerous nanometrology techniques concerned with probing a wide range of frequency-dependent properties would benefit from a cantilevered sensor with tunable natural frequencies. In this work, we propose a method to arbitrarily tune the stiffness and natural frequencies of a microplate sensor for atomic force microscope applications, thereby allowing resonance amplification at a broad range of frequencies. This method is predicated on the principle of curvature-based stiffening. A macroscale experiment is conducted to verify the feasibility of the method. Next, a microscale finite element analysis is conducted on a proof-of-concept device. We show that both the stiffness and various natural frequencies of the device can be controlled through applied transverse curvature. Dynamic phenomena encountered in the method, such as eigenvalue curve veering, are discussed and methods are presented to accommodate these phenomena. We believe that this study will facilitate the development of future curvature-based microscale sensors for atomic force microscopy applications.