Eo, Y. S., Sun, K., Kurdak, Ç., Kim, D.-J., and Fisk, Z. Inverted Resistance Measurements as a Method for Characterizing the Bulk and Surface Conductivities of Three-Dimensional Topological Insulators. Physical Review Applied 9.4 Web. doi:10.1103/PhysRevApplied.9.044006.

Eo, Y. S., Sun, K., Kurdak, Ç., Kim, D.-J., & Fisk, Z. Inverted Resistance Measurements as a Method for Characterizing the Bulk and Surface Conductivities of Three-Dimensional Topological Insulators. Physical Review Applied, 9 (4). https://doi.org/10.1103/PhysRevApplied.9.044006

Eo, Y. S., Sun, K., Kurdak, Ç., Kim, D.-J., and Fisk, Z. "Inverted Resistance Measurements as a Method for Characterizing the Bulk and Surface Conductivities of Three-Dimensional Topological Insulators". Physical Review Applied 9 (4). United States: American Physical Society. https://doi.org/10.1103/PhysRevApplied.9.044006. https://par.nsf.gov/biblio/10056028.

@article{osti_10056028,
place = {United States}, title = {Inverted Resistance Measurements as a Method for Characterizing the Bulk and Surface Conductivities of Three-Dimensional Topological Insulators}, url = {https://par.nsf.gov/biblio/10056028}, DOI = {10.1103/PhysRevApplied.9.044006}, abstractNote = {Not Available}, journal = {Physical Review Applied}, volume = {9}, number = {4}, publisher = {American Physical Society}, author = {Eo, Y. S. and Sun, K. and Kurdak, Ç. and Kim, D.-J. and Fisk, Z.}, }