Ievlev, Anton V., Brown, Chance, Burch, Matthew J., Agar, Joshua C., Velarde, Gabriel A., Martin, Lane W., Maksymovych, Petro, Kalinin, Sergei V., and Ovchinnikova, Olga S. Chemical Phenomena of Atomic Force Microscopy Scanning. Retrieved from https://par.nsf.gov/biblio/10056849. Analytical Chemistry 90.5 Web. doi:10.1021/acs.analchem.7b05225.

Ievlev, Anton V., Brown, Chance, Burch, Matthew J., Agar, Joshua C., Velarde, Gabriel A., Martin, Lane W., Maksymovych, Petro, Kalinin, Sergei V., & Ovchinnikova, Olga S. Chemical Phenomena of Atomic Force Microscopy Scanning. Analytical Chemistry, 90 (5). Retrieved from https://par.nsf.gov/biblio/10056849. https://doi.org/10.1021/acs.analchem.7b05225

Ievlev, Anton V., Brown, Chance, Burch, Matthew J., Agar, Joshua C., Velarde, Gabriel A., Martin, Lane W., Maksymovych, Petro, Kalinin, Sergei V., and Ovchinnikova, Olga S. "Chemical Phenomena of Atomic Force Microscopy Scanning". Analytical Chemistry 90 (5). Country unknown/Code not available. https://doi.org/10.1021/acs.analchem.7b05225. https://par.nsf.gov/biblio/10056849.

@article{osti_10056849,
place = {Country unknown/Code not available}, title = {Chemical Phenomena of Atomic Force Microscopy Scanning}, url = {https://par.nsf.gov/biblio/10056849}, DOI = {10.1021/acs.analchem.7b05225}, abstractNote = {}, journal = {Analytical Chemistry}, volume = {90}, number = {5}, author = {Ievlev, Anton V. and Brown, Chance and Burch, Matthew J. and Agar, Joshua C. and Velarde, Gabriel A. and Martin, Lane W. and Maksymovych, Petro and Kalinin, Sergei V. and Ovchinnikova, Olga S.}, }