Zhou, Tianji, Lanzillo, Nicholas A., Bhosale, Prasad, Gall, Daniel, and Quon, Roger. A first-principles analysis of ballistic conductance, grain boundary scattering and vertical resistance in aluminum interconnects. Retrieved from https://par.nsf.gov/biblio/10058392. AIP Advances 8.5 Web. doi:10.1063/1.5027084.

Zhou, Tianji, Lanzillo, Nicholas A., Bhosale, Prasad, Gall, Daniel, & Quon, Roger. A first-principles analysis of ballistic conductance, grain boundary scattering and vertical resistance in aluminum interconnects. AIP Advances, 8 (5). Retrieved from https://par.nsf.gov/biblio/10058392. https://doi.org/10.1063/1.5027084

Zhou, Tianji, Lanzillo, Nicholas A., Bhosale, Prasad, Gall, Daniel, and Quon, Roger. "A first-principles analysis of ballistic conductance, grain boundary scattering and vertical resistance in aluminum interconnects". AIP Advances 8 (5). Country unknown/Code not available. https://doi.org/10.1063/1.5027084. https://par.nsf.gov/biblio/10058392.

@article{osti_10058392,
place = {Country unknown/Code not available}, title = {A first-principles analysis of ballistic conductance, grain boundary scattering and vertical resistance in aluminum interconnects}, url = {https://par.nsf.gov/biblio/10058392}, DOI = {10.1063/1.5027084}, abstractNote = {}, journal = {AIP Advances}, volume = {8}, number = {5}, author = {Zhou, Tianji and Lanzillo, Nicholas A. and Bhosale, Prasad and Gall, Daniel and Quon, Roger}, }