Qiu, Haian, Dong, Xue, Shim, Jong Hyun, Cho, Junghyun, and Mativetsky, Jeffrey M. Effective charge collection area during conductive and photoconductive atomic force microscopy. Applied Physics Letters 112.26 Web. doi:10.1063/1.5035351.

Qiu, Haian, Dong, Xue, Shim, Jong Hyun, Cho, Junghyun, & Mativetsky, Jeffrey M. Effective charge collection area during conductive and photoconductive atomic force microscopy. Applied Physics Letters, 112 (26). https://doi.org/10.1063/1.5035351

Qiu, Haian, Dong, Xue, Shim, Jong Hyun, Cho, Junghyun, and Mativetsky, Jeffrey M. "Effective charge collection area during conductive and photoconductive atomic force microscopy". Applied Physics Letters 112 (26). United States: American Institute of Physics. https://doi.org/10.1063/1.5035351. https://par.nsf.gov/biblio/10061962.

@article{osti_10061962,
place = {United States}, title = {Effective charge collection area during conductive and photoconductive atomic force microscopy}, url = {https://par.nsf.gov/biblio/10061962}, DOI = {10.1063/1.5035351}, abstractNote = {Not Available}, journal = {Applied Physics Letters}, volume = {112}, number = {26}, publisher = {American Institute of Physics}, author = {Qiu, Haian and Dong, Xue and Shim, Jong Hyun and Cho, Junghyun and Mativetsky, Jeffrey M.}, }