Real-Time Stress Measurement in SiO2 Thin Films during Electrochemical Lithiation/Delithiation Cycling
- Award ID(s):
- 1652409
- NSF-PAR ID:
- 10063062
- Date Published:
- Journal Name:
- Experimental Mechanics
- Volume:
- 58
- Issue:
- 4
- ISSN:
- 0014-4851
- Page Range / eLocation ID:
- 537 to 547
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1007/s11340-017-0371-2
