Klyukin, Konstantin, Tao, L. L., Tsymbal, Evgeny Y., and Alexandrov, Vitaly. Defect-Assisted Tunneling Electroresistance in Ferroelectric Tunnel Junctions. Physical Review Letters 121.5 Web. doi:10.1103/PhysRevLett.121.056601.

Klyukin, Konstantin, Tao, L. L., Tsymbal, Evgeny Y., & Alexandrov, Vitaly. Defect-Assisted Tunneling Electroresistance in Ferroelectric Tunnel Junctions. Physical Review Letters, 121 (5). https://doi.org/10.1103/PhysRevLett.121.056601

Klyukin, Konstantin, Tao, L. L., Tsymbal, Evgeny Y., and Alexandrov, Vitaly. "Defect-Assisted Tunneling Electroresistance in Ferroelectric Tunnel Junctions". Physical Review Letters 121 (5). United States: American Physical Society. https://doi.org/10.1103/PhysRevLett.121.056601. https://par.nsf.gov/biblio/10066834.

@article{osti_10066834,
place = {United States}, title = {Defect-Assisted Tunneling Electroresistance in Ferroelectric Tunnel Junctions}, url = {https://par.nsf.gov/biblio/10066834}, DOI = {10.1103/PhysRevLett.121.056601}, abstractNote = {Not Available}, journal = {Physical Review Letters}, volume = {121}, number = {5}, publisher = {American Physical Society}, author = {Klyukin, Konstantin and Tao, L. L. and Tsymbal, Evgeny Y. and Alexandrov, Vitaly}, }