The security of printed circuit boards (PCBs) has become increasingly vital as supply chain vulnerabilities, including tampering, present significant risks to electronic systems. While detecting tampering on a PCB is the first step for verification, forensics is also needed to identify the modified component. One non-invasive and reliable PCB tamper detection technique with global coverage is the impedance characterization of PCB's power delivery network (PDN). However, it is an open question whether one can use the two-dimensional impedance signatures for forensics purposes. In this work, we introduce a novel PCB forensics approach, using explainable AI (XAI) on impedance signatures. Through extensive experiments, we replicate various PCB tamper events, generating a dataset used to develop an XAI algorithm capable of not only detecting tampering but also explaining why the algorithm makes a decision about whether a tamper event has happened. At the core of our XAI algorithm is a random forest classifier with an accuracy of 96.7%, sufficient to explain the algorithm's decisions. To understand the behavior of the classifier In the decision-making process, we utilized the SHAP values as an XAI tool to determine which frequency component influences the classifier's decision for a particular class the most. This approach enhances detection capabilities as well as advancing the verifier's ability to reverse-engineer and analyze two-dimensional impedance signatures for forensics.
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FBAR-BASED SENSOR FOR WIRELESS RFID AUTHENTICATION OF INTEGRATED CIRCUITS
This paper describes an integrated circuit (IC) authentication and tamper detection system, based on a Film Bulk Acoustic Resonator (FBAR) and passive Radio-Frequency Identification (RFID), which allows for wireless detection of tampering or counterfeiting in packaged ICs. We demonstrate the concept through the use of a 2.6 GHz FBAR based on a Zinc Oxide (ZnO) thin film. The FBAR is series connected to a piezoelectric energy harvester, which can generate voltage pulses with a peak amplitude of 56 V when tampering activity is detected. Our measurements validate this concept and demonstrate that we can permanently alter the high frequency resonance characteristics of the FBAR through dielectric breakdown caused by tampering.
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- Award ID(s):
- 1716953
- PAR ID:
- 10067183
- Date Published:
- Journal Name:
- Technical digest - Solid-State Sensor, Actuator, and Microsystems Workshop
- ISSN:
- 1539-204X
- Page Range / eLocation ID:
- 190-193
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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