Leveraging thermally-aware chiplet organization in 2.5D systems to reclaim dark silicon
- Award ID(s):
- 1716352
- NSF-PAR ID:
- 10074697
- Date Published:
- Journal Name:
- Design, Automation and Test in Europe (DATE)
- Page Range / eLocation ID:
- 1441 to 1446
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
No document suggestions found