Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. Physical Review Applied 9.4 Web. doi:10.1103/PhysRevApplied.9.044040.

Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., & Schwarz, Udo D. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis. Physical Review Applied, 9 (4). https://doi.org/10.1103/PhysRevApplied.9.044040

Dagdeviren, Omur E., Zhou, Chao, Altman, Eric I., and Schwarz, Udo D. "Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis". Physical Review Applied 9 (4). Japan: American Physical Society. https://doi.org/10.1103/PhysRevApplied.9.044040. https://par.nsf.gov/biblio/10079475.

@article{osti_10079475,
place = {Japan}, title = {Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis}, url = {https://par.nsf.gov/biblio/10079475}, DOI = {10.1103/PhysRevApplied.9.044040}, abstractNote = {Not Available}, journal = {Physical Review Applied}, volume = {9}, number = {4}, publisher = {American Physical Society}, author = {Dagdeviren, Omur E. and Zhou, Chao and Altman, Eric I. and Schwarz, Udo D.}, }