Smart, Tyler J., Wu, Feng, Govoni, Marco, and Ping, Yuan. Fundamental principles for calculating charged defect ionization energies in ultrathin two-dimensional materials. Physical Review Materials 2.12 Web. doi:10.1103/PhysRevMaterials.2.124002.

Smart, Tyler J., Wu, Feng, Govoni, Marco, & Ping, Yuan. Fundamental principles for calculating charged defect ionization energies in ultrathin two-dimensional materials. Physical Review Materials, 2 (12). https://doi.org/10.1103/PhysRevMaterials.2.124002

Smart, Tyler J., Wu, Feng, Govoni, Marco, and Ping, Yuan. "Fundamental principles for calculating charged defect ionization energies in ultrathin two-dimensional materials". Physical Review Materials 2 (12). Japan: American Physical Society. https://doi.org/10.1103/PhysRevMaterials.2.124002. https://par.nsf.gov/biblio/10081954.

@article{osti_10081954,
place = {Japan}, title = {Fundamental principles for calculating charged defect ionization energies in ultrathin two-dimensional materials}, url = {https://par.nsf.gov/biblio/10081954}, DOI = {10.1103/PhysRevMaterials.2.124002}, abstractNote = {Not Available}, journal = {Physical Review Materials}, volume = {2}, number = {12}, publisher = {American Physical Society}, author = {Smart, Tyler J. and Wu, Feng and Govoni, Marco and Ping, Yuan}, }