Sun, X.L., Tolba, T., Cao, G.F., Lv, P., Wen, L.J., Odian, A., Vachon, F., Alamre, A., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W.R., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E.V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D.C., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G. S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Xia, Q., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Study of silicon photomultiplier performance in external electric fields. Retrieved from https://par.nsf.gov/biblio/10085091. Journal of Instrumentation 13.09 Web. doi:10.1088/1748-0221/13/09/T09006.

Sun, X.L., Tolba, T., Cao, G.F., Lv, P., Wen, L.J., Odian, A., Vachon, F., Alamre, A., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W.R., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E.V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D.C., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G. S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Xia, Q., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., & Ziegler, T. Study of silicon photomultiplier performance in external electric fields. Journal of Instrumentation, 13 (09). Retrieved from https://par.nsf.gov/biblio/10085091. https://doi.org/10.1088/1748-0221/13/09/T09006

Sun, X.L., Tolba, T., Cao, G.F., Lv, P., Wen, L.J., Odian, A., Vachon, F., Alamre, A., Albert, J.B., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, L., Cen, W.R., Chambers, C., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Côté, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. Der, DeVoe, R., Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fierlinger, P., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E.V., Harris, D., Heffner, M., Hoppe, E. W., Hößl, J., House, A., Hufschmidt, P., Hughes, M., Ito, Y., Iverson, A., Jamil, A., Jessiman, C., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Kravitz, S., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lin, Y.H., MacLellan, R., Michel, T., Moe, M., Mong, B., Moore, D.C., Murray, K., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G. S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Retière, F., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schneider, J., Sinclair, D., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J.-L., Wagenpfeil, M., Wang, Q., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wrede, G., Wu, S.X., Wu, W.H., Xia, Q., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. "Study of silicon photomultiplier performance in external electric fields". Journal of Instrumentation 13 (09). Country unknown/Code not available. https://doi.org/10.1088/1748-0221/13/09/T09006. https://par.nsf.gov/biblio/10085091.

@article{osti_10085091,
place = {Country unknown/Code not available}, title = {Study of silicon photomultiplier performance in external electric fields}, url = {https://par.nsf.gov/biblio/10085091}, DOI = {10.1088/1748-0221/13/09/T09006}, abstractNote = {}, journal = {Journal of Instrumentation}, volume = {13}, number = {09}, author = {Sun, X.L. and Tolba, T. and Cao, G.F. and Lv, P. and Wen, L.J. and Odian, A. and Vachon, F. and Alamre, A. and Albert, J.B. and Anton, G. and Arnquist, I.J. and Badhrees, I. and Barbeau, P.S. and Beck, D. and Belov, V. and Bhatta, T. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, L. and Cen, W.R. and Chambers, C. and Charlebois, S.A. and Chiu, M. and Cleveland, B. and Coon, M. and Côté, M. and Craycraft, A. and Cree, W. and Dalmasson, J. and Daniels, T. and Darroch, L. and Daugherty, S.J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and DeVoe, R. and Dilling, J. and Ding, Y.Y. and Dolinski, M.J. and Dragone, A. and Echevers, J. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fierlinger, P. and Fontaine, R. and Fudenberg, D. and Gallina, G. and Giacomini, G. and Gornea, R. and Gratta, G. and Hansen, E.V. and Harris, D. and Heffner, M. and Hoppe, E. W. and Hößl, J. and House, A. and Hufschmidt, P. and Hughes, M. and Ito, Y. and Iverson, A. and Jamil, A. and Jessiman, C. and Jewell, M.J. and Jiang, X.S. and Karelin, A. and Kaufman, L.J. and Kodroff, D. and Koffas, T. and Kravitz, S. and Krücken, R. and Kuchenkov, A. and Kumar, K.S. and Lan, Y. and Larson, A. and Leonard, D.S. and Li, G. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y.H. and MacLellan, R. and Michel, T. and Moe, M. and Mong, B. and Moore, D.C. and Murray, K. and Newby, R.J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Oriunno, M. and Orrell, J.L. and Ortega, G. S. and Ostrovskiy, I. and Overman, C.T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J.-F. and Qiu, D. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Retière, F. and Robinson, A. and Rossignol, T. and Rowson, P.C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schneider, J. and Sinclair, D. and VIII, K. Skarpaas and Soma, A.K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Tarka, M. and Todd, J. and Totev, T.I. and Tsang, R. and Tsang, T. and Veenstra, B. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J.-L. and Wagenpfeil, M. and Wang, Q. and Watkins, J. and Weber, M. and Wei, W. and Wichoski, U. and Wrede, G. and Wu, S.X. and Wu, W.H. and Xia, Q. and Yang, L. and Yen, Y.-R. and Zeldovich, O. and Zhao, J. and Zhou, Y. and Ziegler, T.}, }