Ensley, Trenton R., Benis, Sepehr, Hu, Honghua, Li, Zhong’an, Jang, Sei-Hum, Jen, Alex K. -Y., Perry, Joseph W., Hales, Joel M., Hagan, David J., and Van Stryland, Eric W. Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method. Applied Optics 58.13 Web. doi:10.1364/AO.58.000D28.

Ensley, Trenton R., Benis, Sepehr, Hu, Honghua, Li, Zhong’an, Jang, Sei-Hum, Jen, Alex K. -Y., Perry, Joseph W., Hales, Joel M., Hagan, David J., & Van Stryland, Eric W. Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method. Applied Optics, 58 (13). https://doi.org/10.1364/AO.58.000D28

Ensley, Trenton R., Benis, Sepehr, Hu, Honghua, Li, Zhong’an, Jang, Sei-Hum, Jen, Alex K. -Y., Perry, Joseph W., Hales, Joel M., Hagan, David J., and Van Stryland, Eric W. "Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method". Applied Optics 58 (13). Country unknown/Code not available: Optical Society of America. https://doi.org/10.1364/AO.58.000D28. https://par.nsf.gov/biblio/10088151.

@article{osti_10088151,
place = {Country unknown/Code not available}, title = {Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method}, url = {https://par.nsf.gov/biblio/10088151}, DOI = {10.1364/AO.58.000D28}, abstractNote = {Not Available}, journal = {Applied Optics}, volume = {58}, number = {13}, publisher = {Optical Society of America}, author = {Ensley, Trenton R. and Benis, Sepehr and Hu, Honghua and Li, Zhong’an and Jang, Sei-Hum and Jen, Alex K. -Y. and Perry, Joseph W. and Hales, Joel M. and Hagan, David J. and Van Stryland, Eric W.}, }