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Title: Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor
Award ID(s):
1707080
PAR ID:
10098251
Author(s) / Creator(s):
; ; ; ; ; ; ;
Date Published:
Journal Name:
Nanoscale and Microscale Thermophysical Engineering
Volume:
22
Issue:
4
ISSN:
1556-7265
Page Range / eLocation ID:
348 to 359
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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