Cao, Y., Zhu, S., Xie, Y., Key, J., Kacher, J., Unocic, R. R., and Rouleau, C. M. Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM). Retrieved from https://par.nsf.gov/biblio/10104282. 2018 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) . Web. doi:10.1109/ICASSP.2018.8461334.

Cao, Y., Zhu, S., Xie, Y., Key, J., Kacher, J., Unocic, R. R., & Rouleau, C. M. Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM). 2018 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), (). Retrieved from https://par.nsf.gov/biblio/10104282. https://doi.org/10.1109/ICASSP.2018.8461334

Cao, Y., Zhu, S., Xie, Y., Key, J., Kacher, J., Unocic, R. R., and Rouleau, C. M. "Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM)". 2018 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) (). Country unknown/Code not available. https://doi.org/10.1109/ICASSP.2018.8461334. https://par.nsf.gov/biblio/10104282.

@article{osti_10104282,
place = {Country unknown/Code not available}, title = {Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM)}, url = {https://par.nsf.gov/biblio/10104282}, DOI = {10.1109/ICASSP.2018.8461334}, abstractNote = {}, journal = {2018 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)}, author = {Cao, Y. and Zhu, S. and Xie, Y. and Key, J. and Kacher, J. and Unocic, R. R. and Rouleau, C. M.}, }